The Henry C. Lee Institute of Forensic Science offers many different visiting scholar programs. Visiting scholars have come from many parts of the world including China, Taiwan, Qatar, Singapore, Europe and others. Duration of study ranges from a few days to 6 months or more. The curriculum of their studies include classroom lectures by Dr. Lee and other experts in their fields, practical lab experiments, and visits to law enforcement agencies, forensic science labs, and other educational facilities. Programs can be customized according to the group’s special interests in certain areas.
The Institute has opportunities for scholarships for international scholars who wish to advance their knowledge in the forensic sciences. For information, please contact ifs@newhaven.edu
Dr. Lee has been a member of the faculty at the University of New Haven since 1975 and helped establish one of the foremost academic forensic programs in the world. The University and its students are world-renowned in this field. You can visit www.newhaven.edu to find out more about undergraduate and graduate study in the University of New Haven’s Henry C. Lee College of Criminal Justice and Forensic Sciences.
The Henry C. Lee Institute of Forensic Science is housed in a state-of-the-art building on the University of New Haven campus. While we work hand-in-hand toward a common goal, it is important to note the Lee Institute is a separate entity that works closely with the University.
Through training, consultation, research and a unique public learning center, the Institute’s goal is to make the criminal justice system more effective. Toward that goal, we provide unique and effective training programs and cutting edge resources to professionals in the law enforcement fields.
More About Dr. Lee
Dr. Henry C. Lee is the founding father of the Institute. The legendary investigator is known for finding the tiniest clues. He has even solved a murder without a body. Find out more about the world-famous investigator on https://www.facebook.com/DrHenryLee.
